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产品中心

Wafer Defect Detector

Size:

Customized according to requirements
Main Features And Advantages:

Compatible with a variety of different specifications
Functional scalability, according to customer needs to increase or decrease the function
High detection efficiency, can be imported high-end equipment
Intelligent detection and defect classification and identification to further reduce the workload of manual re-inspection
Establish defect database for customers and realize intelligent control of process